RADIO IC DEVICE, INSPECTION SYSTEM THEREOF, AND METHOD FOR MANUFACTURING RADIO IC DEVICE BY USING THE INSPECTION SYSTEM

摘要

PROBLEM TO BE SOLVED: To provide a radio IC device which can be downsized and facilitates the inspection of characteristics, to provide an inspection system capable of efficiently inspecting characteristics of the radio IC device, and to provide a method for manufacturing the radio IC device by using the inspection system.

SOLUTION: This radio IC device is provided with a radio IC chip 5 for processing a transmission/reception signal and a power supply circuit substrate 10 including a resonance circuit having an inductance element. External electrodes 19a and 19b electro-magnetically coupled with the resonance circuit are formed on the surface of the power supply circuit substrate, and the radio IC chip 5 is operated according to a signal received by the external electrodes 19a and 19b, and a response signal from the radio IC chip 5 is emitted from the external electrodes 19a and 19b to the outside.

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