发明名称 SEMICONDUCTOR TRANSISTORS HAVING REDUCED DISTANCES BETWEEN GATE ELECTRODE REGIONS
摘要 A semiconductor structure and a method for forming the same. The method includes providing a semiconductor structure which includes a semiconductor substrate. The semiconductor substrate includes (i) a top substrate surface which defines a reference direction perpendicular to the top substrate surface and (ii) first and second semiconductor body regions. The method further includes forming (i) a gate divider region and (ii) a gate electrode layer on top of the semiconductor substrate. The gate divider region is in direct physical contact with gate electrode layer. A top surface of the gate electrode layer and a top surface of the gate divider region are essentially coplanar. The method further includes patterning the gate electrode layer resulting in a first gate electrode region and a second gate electrode region. The gate divider region does not overlap the first and second gate electrode regions in the reference direction.
申请公布号 US2009032886(A1) 申请公布日期 2009.02.05
申请号 US20070830090 申请日期 2007.07.30
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 WONG ROBERT C.;YANG HAINING S.
分类号 H01L27/088;H01L21/8234 主分类号 H01L27/088
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