发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device using a semiconductor element capable of applying compressive stress to a region of a semiconductor film where carriers move is free from the material or film thickness of an interlayer insulating film. SOLUTION: A cavity is formed between the semiconductor film uses as an active layer of a transistor, and a base substrate. A region of the semiconductor film which overlaps the cavity is deformed toward the base substrate. Then the transistor has a gate insulating film and an electrode, stacked in order, in the region of the semiconductor film overlapping the cavity. The transistor, therefore, has a channel formation region in the region where the semiconductor film is deformed. Further, the transistor may have a source or drain formed in the region where the semiconductor film is deformed in addition to the channel formation region. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009026917(A) 申请公布日期 2009.02.05
申请号 JP20070187883 申请日期 2007.07.19
申请人 SEMICONDUCTOR ENERGY LAB CO LTD 发明人 MIYAIRI HIDEKAZU
分类号 H01L29/786;H01L21/02;H01L21/336;H01L27/12 主分类号 H01L29/786
代理机构 代理人
主权项
地址