发明名称 |
NON-VOLATILE MEMORY HAVING A DYNAMICALLY ADJUSTABLE SOFT PROGRAM VERIFY VOLTAGE LEVEL AND METHOD THEREFOR |
摘要 |
<p>An erase operation in a non-volatile memory (10) includes selecting a block (14, 16, or 18) on which to perform an erase operation, erasing the selected block? receiving test data corresponding to the selected block, determining a soft program verify voltage level based on the test data, and soft programming the erased selected block using the soft program verify voltage level. A non-volatile memory (10) includes a plurality of blocks, a test block (20) which stores test data corresponding to each of the plurality of blocks, and a flash control (30) coupled to the plurality of blocks and the test block, the flash control determining a soft program verify voltage level for a particular block of the plurality of blocks based on the test data for the particular block when the particular block is being soft programmed.</p> |
申请公布号 |
WO2009017889(A1) |
申请公布日期 |
2009.02.05 |
申请号 |
WO2008US67222 |
申请日期 |
2008.06.17 |
申请人 |
FREESCALE SEMICONDUCTOR INC.;EGUCHI, RICHARD K.;CHOY, JON S. |
发明人 |
EGUCHI, RICHARD K.;CHOY, JON S. |
分类号 |
G11C16/04;G11C7/00;G11C11/34 |
主分类号 |
G11C16/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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