发明名称 NON-VOLATILE MEMORY HAVING A DYNAMICALLY ADJUSTABLE SOFT PROGRAM VERIFY VOLTAGE LEVEL AND METHOD THEREFOR
摘要 <p>An erase operation in a non-volatile memory (10) includes selecting a block (14, 16, or 18) on which to perform an erase operation, erasing the selected block? receiving test data corresponding to the selected block, determining a soft program verify voltage level based on the test data, and soft programming the erased selected block using the soft program verify voltage level. A non-volatile memory (10) includes a plurality of blocks, a test block (20) which stores test data corresponding to each of the plurality of blocks, and a flash control (30) coupled to the plurality of blocks and the test block, the flash control determining a soft program verify voltage level for a particular block of the plurality of blocks based on the test data for the particular block when the particular block is being soft programmed.</p>
申请公布号 WO2009017889(A1) 申请公布日期 2009.02.05
申请号 WO2008US67222 申请日期 2008.06.17
申请人 FREESCALE SEMICONDUCTOR INC.;EGUCHI, RICHARD K.;CHOY, JON S. 发明人 EGUCHI, RICHARD K.;CHOY, JON S.
分类号 G11C16/04;G11C7/00;G11C11/34 主分类号 G11C16/04
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