发明名称 POST CMP SCRUBBING OF SUBSTRATES
摘要 A cleaning method is provided for brush cleaning a surface of a substrate. The method comprises scrubbing a first surface of the substrate with a brush having a first surface geometry; and then scrubbing the first surface of the substrate with a brush having a second surface geometry, wherein the first and the second surface geometries are different. Numerous other aspects are provided.
申请公布号 US2009031512(A1) 申请公布日期 2009.02.05
申请号 US20080249927 申请日期 2008.10.11
申请人 APPLIED MATERIALS, INC. 发明人 SIN GARRETT H.;KO TERRY KIN-TING;HUEY SIDNEY P.
分类号 B08B1/02;B08B1/04;B08B3/02;B08B3/04;H01L21/00 主分类号 B08B1/02
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