发明名称 Organometallic precursor, thin film having the same, metal wiring including the thin film, method of forming a thin film and method of manufacturing a metal wiring using the same
摘要 Disclosed are an organometallic precursor that may be used in manufacturing a semiconductor device, a thin film having the same, a metal wiring including the thin film, a method of forming a thin film and a method of manufacturing a metal wiring. An organometallic precursor including a central metal, a borohydride ligand and an amine ligand for reducing a polarity of the organometallic precursor may be provided onto a substrate, and may be thermally decomposed to form a thin film on the substrate. The organometallic precursor having a reduced polarity may be provided to a chamber with a constant flow rate, and thus stability and/or efficiency of a semiconductor manufacturing process may be improved.
申请公布号 US2009035516(A1) 申请公布日期 2009.02.05
申请号 US20080219983 申请日期 2008.07.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHO YOUN-JOUNG;LEE JUNG-HO;CHO JUN-HYUN;RYU SEUNG-MIN;CHO KYOO-CHUL;CHOI JUNG-SIK
分类号 B32B3/24;B05D3/00;B05D3/02;B05D5/12;C01B35/14;C23C16/00;C23C16/455 主分类号 B32B3/24
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