| 摘要 |
PROBLEM TO BE SOLVED: To dispose probes equal in number to electrodes of a single integrated circuit within a probe disposition region corresponding in size to the integrated circuit, although each of the probes has an elongated portion extending in a transverse direction. SOLUTION: An electrical connection device includes: a probe attaching body having one surface provided with at least one probe disposition region and a plurality of lands provided within the probe disposition region; and a plurality of probes located within the probe disposition region as viewed flatways. Each of the probes includes: an attaching portion extending from a land in a longitudinal direction that intersects with the probe disposition region and having one end attached to the land; an arm portion extending from the other end of the attaching portion in a transverse direction; an elongated portion extending from a top of the arm portion in a direction opposite to the attaching portion; and a needlepoint provided at a top of the elongated portion. At least one of the probes has an arm portion extending from an arm portion of at least one other probe toward an attaching portion or an elongated portion of another probe with a space in a direction that crosses an arm portion of another probe. COPYRIGHT: (C)2009,JPO&INPIT
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