发明名称 Positive resist composition and method of pattern formation with the same
摘要 A positive resist compositions comprising: (A) a resin which comes to have an enhanced solubility in an alkaline developing solution by an action of an acid; (B) a compound which generates an acid upon irradiation with actinic rays or a radiation; (C) a fluorine-containing compound containing at least one group (y); and (F) a solvent, and a method of pattern formation with the composition: (x) an alkali-soluble group; (y) a group which decomposes by an action of an alkaline developing solution to enhance a solubility in an alkaline developing solution; and (z) a group which decomposes by an action of an acid.
申请公布号 EP2020618(A2) 申请公布日期 2009.02.04
申请号 EP20080165714 申请日期 2006.07.25
申请人 FUJIFILM CORPORATION 发明人 KANDA, HIROMI;KANNA, SHINICHI;INABE, HARUKI
分类号 G03F7/039;G03F7/004;G03F7/20 主分类号 G03F7/039
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