发明名称 |
PHASE-CHANGE RANDOM ACCESS MEMORY DEVICE AND METHOD OF FABRICATING THE SAME |
摘要 |
<p>A phase change memory device and a manufacturing method thereof are provided to reduce the amount of the reset current applied to the phase change material pattern by preventing the loss of heat from the lower electrode. A phase change memory device comprises a lower electrode(135), a heat interception pattern(142), a phase change material pattern(144), and an upper electrode(146). The lower electrode electrically connects with the semiconductor substrate. The heat-blocking pattern is arranged on the lower electrode. The heat interception pattern comprises srRuO3 and SrHfO3. The phase change material pattern is arranged on the heat-blocking pattern. The upper electrode is arranged on the phase change material pattern.</p> |
申请公布号 |
KR20090012829(A) |
申请公布日期 |
2009.02.04 |
申请号 |
KR20070076996 |
申请日期 |
2007.07.31 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
HEO, JANG EUN;AHN, DONG HO |
分类号 |
H01L27/115 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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