发明名称 PHASE-CHANGE RANDOM ACCESS MEMORY DEVICE AND METHOD OF FABRICATING THE SAME
摘要 <p>A phase change memory device and a manufacturing method thereof are provided to reduce the amount of the reset current applied to the phase change material pattern by preventing the loss of heat from the lower electrode. A phase change memory device comprises a lower electrode(135), a heat interception pattern(142), a phase change material pattern(144), and an upper electrode(146). The lower electrode electrically connects with the semiconductor substrate. The heat-blocking pattern is arranged on the lower electrode. The heat interception pattern comprises srRuO3 and SrHfO3. The phase change material pattern is arranged on the heat-blocking pattern. The upper electrode is arranged on the phase change material pattern.</p>
申请公布号 KR20090012829(A) 申请公布日期 2009.02.04
申请号 KR20070076996 申请日期 2007.07.31
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HEO, JANG EUN;AHN, DONG HO
分类号 H01L27/115 主分类号 H01L27/115
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