发明名称 Method of manufacturing semiconductor device
摘要 A method of manufacturing a semiconductor device is provided. The method includes: (A) forming an insulating film with a porous structure on a substrate; (B) forming a trench in the insulating film, the trench being used for forming an interconnection; (C) depositing a metal layer over the insulating film such that the trench is filled in with the metal layer; (D) forming the interconnection by removing an excess metal layer outside the trench; (E) modifying a surface of the insulating film to form a modified layer on the insulating film; and (F) forming a metal film selectively on the interconnection by using plating solution after the (E) modifying process.
申请公布号 US7485566(B2) 申请公布日期 2009.02.03
申请号 US20060543947 申请日期 2006.10.06
申请人 NEC ELECTRONICS CORPORATION 发明人 KAWAHARA NAOYOSHI;UENO KAZUYOSHI
分类号 H01L21/4763 主分类号 H01L21/4763
代理机构 代理人
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