发明名称 Method for fabricating superlattice semiconductor structure using chemical vapor deposition
摘要 The invention provides a method for fabricating a superlattice semiconductor structure capable of achieving excellent interfacial properties and uniformity. For the superlattice semiconductor structure according to the invention, a substrate is mounted on a susceptor within a process chamber. First and second source gases are supplied simultaneously to two different areas on the susceptor within the chamber to form first and second source gas areas separate from each other. The susceptor is rotated to revolve the substrate through the first and second source gas areas.
申请公布号 US7485583(B2) 申请公布日期 2009.02.03
申请号 US20060328227 申请日期 2006.01.10
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD. 发明人 KIM BUM JOON;KIM YOUNG MIN;SHIN YOUNG CHUL
分类号 H01L21/205;C23C16/455;C30B25/02;C30B29/38;C30B29/40;C30B29/68 主分类号 H01L21/205
代理机构 代理人
主权项
地址