| 摘要 |
A logic failure diagnosis system for performing logic failure diagnosis and methods for manufacturing and using same. The logic failure diagnosis system includes a signature register system and a space compaction system and, during testing, receives data values from a predetermined number of scan chains. During each scan cycle, the signature register system combines a set of data values with a set of recirculated data values to provide a set of data signature values. The signature register system recirculates the data signature values from the preceding scan cycle to provide the recirculated data values. The space compaction system compresses the data signature values to provide a compressed scan chain signature for the scan chains. The compressed scan chain signature can be compared with a set of expected values to determine whether the scan chains include any erroneous values and, if so, to identify a source of the erroneous values.
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