发明名称 Method for detecting and monitoring defects
摘要 A method that uses a goodness of fit test/measurement (e.g., correction coefficient) for process control of a test parameter (e.g., resistance). At least the minimum number of test values required to calculate a goodness of fit test is obtained. A curve is fitted for the test parameters values and the independent variable(s). A goodness of fit measurement/test (e.g., correlation coefficient) is calculated for the curve and data. The goodness of fit measurement value is used for process control. Control limits can be established on the goodness of fit measurement values. The use of the goodness of fit test is a sensitive test that can used to control processes with low level defects or small fluctuations.
申请公布号 US7487064(B2) 申请公布日期 2009.02.03
申请号 US20030622247 申请日期 2003.07.18
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING, LTD. 发明人 LIM SHELDON C. P.
分类号 G06F19/00;G06F15/00;G06F17/18;H01L21/66 主分类号 G06F19/00
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