发明名称 Abrupt junction formation by atomic layer epitaxy of in situ delta doped dopant diffusion barriers
摘要 A method including forming a channel region between source and drain regions in a substrate, the channel region including a first dopant profile; and forming a barrier layer between the channel region and a well of the substrate, the barrier layer including a second dopant profile different from the first dopant profile. An apparatus including a gate electrode on a substrate; source and drain regions formed in the substrate and separated by a channel region; and a barrier layer between a well of the substrate and the channel region, the barrier layer including a dopant profile different than a dopant profile of the channel region and different than a dopant profile of the well. A system including a computing device including a microprocessor, the microprocessor including a plurality of transistor devices formed in a substrate, each of the plurality of transistor devices including a gate electrode on the substrate; source and drain regions formed in the substrate and separated by a channel region; and a barrier layer between a well of the substrate and the channel region.
申请公布号 US7485536(B2) 申请公布日期 2009.02.03
申请号 US20050326178 申请日期 2005.12.30
申请人 INTEL CORPORATION 发明人 JIN BEEN-YIH;DOYLE BRIAN S.;CHAU ROBERT S.;KAVALIEROS JACK T.
分类号 H01L21/335 主分类号 H01L21/335
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