发明名称 Method for controlling parallelism between probe card and mounting table, storage medium storing inspection program, and inspection apparatus
摘要 In a method for controlling a parallelism between a probe card having a number of probe pins and a mounting table, first, among the probe pins, one or more probe pins corresponding to each of plural distinct locations on an X-Y coordinate system whose origin lies at a probe center are selected. Then, a tip of each of the selected probe pins is detected to obtain position coordinates (X,Y,Z) thereof. Thereafter, a specific point on each of connection lines connecting tips of neighboring selected probe pins is selected and their position coordinates on the connection lines are calculated, wherein the position coordinates of the specific points are set as position coordinates (X,Y,Z) of tips of imaginary probe pins. Subsequently, the parallelism between the probe card and the mounting table based on the position coordinates (X,Y,Z) of the tips of the imaginary probe pins is adjusted.
申请公布号 US7486089(B2) 申请公布日期 2009.02.03
申请号 US20060517248 申请日期 2006.09.08
申请人 TOKYO ELECTRON LIMITED 发明人 ABE HIRONOBU
分类号 G01R31/02 主分类号 G01R31/02
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