| 摘要 |
An automated test system for a device under test (DUT) compresses the stimulus waveform before transferring it to a storage device or over a data transfer interface. The compressed stimulus waveform data are decompressed, and if required converted to analog form, then applied as a stimulus to the DUT. In response, the DUT produces a response waveform. The response waveform is compressed before transferring it to a storage device or over a data transfer interface. If the response waveform is analog, it is converted to digital before compression. The compressed waveform is decompressed for further analysis or display by a host computer. Features of the response waveform can be calculated from the compressed or uncompressed waveform data. Several configurations that include compression and decompression of stimulus and/or response waveforms in test systems are described.
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