发明名称 PROBE STRUCTURE WITH ELECTRONIC COMPONENTS
摘要 A probe apparatus can include a substrate, a contact structure attached to the substrate, and an electronic component electrically connected to the contact structure. The electronic component can be attached to the contact structure.
申请公布号 KR20090012242(A) 申请公布日期 2009.02.02
申请号 KR20087028282 申请日期 2008.11.19
申请人 FORMFACTOR, INCORPORATED 发明人 KHANDROS IGOR K.;GRITTERS JOHN K.
分类号 G01R1/067 主分类号 G01R1/067
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