发明名称 TOPOGRAPHY DIRECTED PATTERNING
摘要 <p>A pattern having exceptionally small features is formed on a partially fabricated integrated circuit (102) during integrated circuit fabrication. The pattern comprises features (162), (164) formed by self-organizing material, such as diblock copolymers. The organization of the copolymers is directed by spacers (152) which have been formed by a pitch multiplication process in which the spacers (152) are formed at the sides of sacrificial mandrels (142), which are later removed to leave the spaced-apart, free-standing spacers (152). Diblock copolymers, composed of two immiscible block species, are deposited over and in the space between the spacers (152). The copolymers are made to self-organize, with each block species aggregating with other block species of the same type.</p>
申请公布号 KR20090009788(A) 申请公布日期 2009.01.23
申请号 KR20087023691 申请日期 2007.05.14
申请人 MICRON TECHNOLOGY, INC. 发明人 SANDHU GURTEJ S.
分类号 H01L21/027 主分类号 H01L21/027
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