发明名称 METHOD AND APPARATUS FOR FORMING AMORPHOUS FILM, AND METHOD FOR MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method and an apparatus for improving electrical characteristics of a film by reducing an amount of impurities in the film and improving film density without deteriorating the morphology of an amorphous film that is formed when forming the amorphous film on a substrate by using the supercritical deposition method. SOLUTION: By a method having (a) a step for depositing an amorphous film on a substrate by supplying a precursor solution that is a film precursor dissolved in a supercritical fluid into a deposition chamber, and (b) a step for heat-treating the amorphous film under a heat-treating atmospheric gas at a temperature that is lower than its crystallization temperature, the amorphous film is formed on the substrate. The step (b) may be performed in the deposition chamber, or performed in a heat treatment chamber different from the deposition chamber. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009016651(A) 申请公布日期 2009.01.22
申请号 JP20070178261 申请日期 2007.07.06
申请人 ELPIDA MEMORY INC 发明人 OIDE HIROYUKI
分类号 H01L21/316;C23C16/455;H01L21/8242;H01L27/108 主分类号 H01L21/316
代理机构 代理人
主权项
地址