发明名称 Method for fabricating semiconductor device
摘要 To provide a fine transistor of high precision. A method for fabricating a transistor comprises the step of forming a gate electrode (340) on the surface of a semiconductor substrate, the step of introducing an impurity across said gate electrode (340), and the step of activating said impurity, thereby to form a source/drain region (310, 320) in the region having said impurity introduced thereinto. In the transistor fabricating method, the step of introducing said impurity includes a plasma irradiating step. The method further comprises the step of forming, prior to said activating step, a reflection preventing film (400) on the surface of the region having said impurity introduced thereinto, so that the optical reflectivity of said impurity introduced region may be lower than the reflectivity of said gate electrode surface.
申请公布号 US2009023262(A1) 申请公布日期 2009.01.22
申请号 US20050659197 申请日期 2005.08.03
申请人 JIN CHENG-GUO;SASAKI YUICHIRO;ITO HIROYUKI;MIZUNO BUNJI 发明人 JIN CHENG-GUO;SASAKI YUICHIRO;ITO HIROYUKI;MIZUNO BUNJI
分类号 H01L21/336 主分类号 H01L21/336
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