发明名称 DEFECT CORRECTION METHOD AND DEFECT CORRECTION APPARATUS
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a defect correction method capable of easily correcting a defect of rib chipping occurred in a manufacturing process of a high definition/high luminance PDP. <P>SOLUTION: In the defect correction method, a rib-chipping defect 36 is rectified before applying a correction paste 10 on the rib-chipping defect 36, and the inclination in width direction of the bottom part of the rib-chipping defect 36 is lessened so that the correction paste 10 applied on the rib-chipping defect 36 may not hang down to the side. Thereby, the hung-down correction paste 10 is not required to be removed by a scratch needle, and the rib-chipping defect 36 occurred in the manufacturing process of the high definition/high luminance type PDP with a small gap between the ribs can be corrected easily. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2009016176(A) 申请公布日期 2009.01.22
申请号 JP20070176444 申请日期 2007.07.04
申请人 NTN CORP 发明人 YADA YUJI
分类号 H01J9/50;H01J11/02;H01J11/22;H01J11/24;H01J11/34;H01J11/36 主分类号 H01J9/50
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