发明名称 SILICON CARBIDE SEMICONDUCTOR DEVICE WITH JUNCTION BARRIER SCHOTTKY DIODE
摘要 <p><P>PROBLEM TO BE SOLVED: To balance provision of a high breakdown voltage with reduction of resistance of a semiconductor layer formed on a surface of a drift layer for forming a PN diode. <P>SOLUTION: In relation to regions interposed among respective p-type layers 8a-8e within the respective p-type layers 8a-8e and an n- -type drift layer 2, design to make their charge amounts coincide with one another, that is, design to make the charge amounts (hole charge amounts) of the respective p-type layers 8a-8e coincide with the charge amounts (electron charge amounts) of the regions interposed among the respective p-type layers 8a-8e within the respective p-type layers and the n- -type drift layer 2 is carried out. When it is assumed that the charge amounts are made to coincide with each other, design of each part can be easily carried out, and a JBS (junction barrier Schottky diode) capable of balancing provision of a high breakdown voltage with reduction of resistance of the p-type layers 8a-8e for forming a PN diode can be easily designed. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2009016603(A) 申请公布日期 2009.01.22
申请号 JP20070177284 申请日期 2007.07.05
申请人 DENSO CORP 发明人 OKUNO HIDEKAZU;YAMAMOTO TAKEO
分类号 H01L29/47;H01L29/06;H01L29/861;H01L29/872 主分类号 H01L29/47
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