| 摘要 |
A system and method for creating different start cache and bus states using multiple test patterns for processor design verification and validation is presented. A test pattern generator/tester re-uses test patterns in different configurations that alter cache states and translation lookaside buffer (TLB) states, which produces different timing scenarios on a broadband bus. The test pattern generator/tester creates multiple test patterns for a multi-processor system and executes the test patterns repeatedly in different configurations without rebuilding the test patterns. This enables a system to dedicate more time executing the test patterns instead of building the test patterns. By repeatedly executing the same test patterns in a different configuration, the invention described herein produces different start cache states, different TLB states, along with other processor units, each time the test patterns execute that, in turn, changes the bus timing.
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