发明名称 |
INTEGRATED CIRCUIT HAVING BUILT-IN SELF-TEST FEATURES |
摘要 |
An integrated circuit and a method of built-in self test in the integrated circuit employ an offset control node and offset capabilities with the integrated circuit in order to communicate and distribute a built-in self-test signal. The built-in self-test signal can emulate signals internal to the integrated circuit during normal operation, and/or the built-in self-test signal can have other signal characteristics representative of signals other than those signals internal to the integrated circuit during normal operation.
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申请公布号 |
US2009024889(A1) |
申请公布日期 |
2009.01.22 |
申请号 |
US20070779354 |
申请日期 |
2007.07.18 |
申请人 |
FORREST GLENN A;LAMAR WASHINGTON |
发明人 |
FORREST GLENN A.;LAMAR WASHINGTON |
分类号 |
G01R31/3187 |
主分类号 |
G01R31/3187 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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