发明名称 |
Method for Delineation of Phase Change Memory Cell Via Film Resistivity Modification |
摘要 |
A PCM cell structure comprises a lower electrode composed of a Phase Change Memory (PCM) layer and a conductive encapsulating upper electrode layer. The PCM is protected from damage by a conductive encapsulating layer. Electrical isolation between adjacent cells is provided by modifying the conductivity of the PCM layer and the conductive encapsulating upper electrode layer subsequent to deposition.
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申请公布号 |
US2009020739(A1) |
申请公布日期 |
2009.01.22 |
申请号 |
US20070781239 |
申请日期 |
2007.07.21 |
申请人 |
INTERNATIONAL BUSINESS MACHINES CORPORATION |
发明人 |
ARNOLD JOHN CHRISTOPHER;CARMICHAEL TRICIA BREEN |
分类号 |
H01L47/00;H01L21/00 |
主分类号 |
H01L47/00 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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