发明名称 COMPOUND SEMICONDUCTOR WAFER, METHOD OF MANUFACTURING LIGHT EMITTING ELEMENT, AND EVALUATION METHOD
摘要 <P>PROBLEM TO BE SOLVED: To provide a compound semiconductor wafer suppressed in formation of voids and cracks to a stuck interface; to provide a method of manufacturing a light emitting element; and to provide an evaluation method. <P>SOLUTION: The compound semiconductor wafer includes at least a luminescent layer part, a window layer formed on a first principal surface side of the luminescent layer part, and a laminating substrate laminated on a second principal surface side of the luminescent layer part. The compound semiconductor wafer is characterized in that an irregularity treatment is applied to each peripheral part of the luminescent layer part and the window layer. <P>COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009016517(A) 申请公布日期 2009.01.22
申请号 JP20070175985 申请日期 2007.07.04
申请人 SHIN ETSU HANDOTAI CO LTD 发明人 KUME FUMITAKA;IKEDA ATSUSHI;YASUTOMI KEIZO;SUZUKI YUKARI;KIKUCHI MAKOTO
分类号 H01L33/14;H01L33/22;H01L33/30 主分类号 H01L33/14
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