发明名称 METHOD FOR CLEANING CVD-SiC COMPACT
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a cleaning method where the damage of the worked face in a CVD-SiC compact, impurities produced upon working or the like can be effectively removed. <P>SOLUTION: Disclosed is a method for cleaning a CVD-SiC compact characterized in that an SiC compact produced by a CVD process is worked, so as to be a desired shape, and is subjected to acid cleaning, next, (1) an electrolytic polishing treatment where a positive potential of≥2.0 V is applied with the CVD-SiC compact as an anode, so as to form a film of silicon dioxide on the surface thereof and (2) a dissolving/removing treatment for the silicon dioxide film with hydrofluoric acid based acid are performed in succession, and thereafter, the SiC compact is cleaned with pure water and is dried. <P>COPYRIGHT: (C)2009,JPO&INPIT</p>
申请公布号 JP2009013489(A) 申请公布日期 2009.01.22
申请号 JP20070179645 申请日期 2007.07.09
申请人 TOKAI CARBON CO LTD 发明人 TOKUNAGA TAKESHI
分类号 C25F3/30;B08B3/08;C04B41/91;C23C16/56;H01L21/304 主分类号 C25F3/30
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