发明名称 Avalanche Photodiode With Edge Breakdown Suppression
摘要 The invention relates to an avalanche photodiode having enhanced gain uniformity enabled by a tailored diffused p-n junction profile. The tailoring is achieved by a two stage doping process incorporating a solid source diffusion in combination with conventional gas source diffusion. The solid source diffusion material is selected for its solubility to the dopant compared to the solubility of the multiplication layer to dopant. The solid source has a diameter between the first and second diffusion windows. Thus, there are three distinct diffusion regions during the second diffusion. The dopant in the multiplication layer at the edge region, the dopant from the solid source material with a relatively higher dopant concentration (limited by the solubility of the dopant in the solid source material) at the intermediate region, and the central region exposed to an infinite diffusion source from the solid source material as it is continually charged with new dopant from the external gas source. The result is that both the dopant concentration and the diffusion depth decrease gradually from the center to the edge of the device. This tailored diffusion profile enables control of the electric field distribution such that edge breakdown is suppressed.
申请公布号 US2009020782(A1) 申请公布日期 2009.01.22
申请号 US20080173189 申请日期 2008.07.15
申请人 JDS UNIPHASE CORPORATION 发明人 PAN ZHONG;VENABLES DAVID;CIESLA CRAIG
分类号 H01L31/0336;H01L31/18 主分类号 H01L31/0336
代理机构 代理人
主权项
地址
您可能感兴趣的专利