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发明名称
Exchange apparatus of tested specimen during the high-temperature exposure
摘要
申请公布号
KR200443275(Y1)
申请公布日期
2009.01.22
申请号
KR20070015930U
申请日期
2007.09.28
申请人
发明人
分类号
G01N25/00
主分类号
G01N25/00
代理机构
代理人
主权项
地址
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