| 摘要 |
An apparatus for estimating a sampling frequency offset includes a waveform characteristic extraction unit, a variation quantity calculation unit, and a SFO (sampling frequency offset) estimator. The waveform characteristic extraction unit extracts a waveform characteristic of a training sequence period in one frame period of a sample data signal and outputs a waveform characteristic value corresponding to the waveform characteristic of the training sequence period. The variation quantity calculation unit calculates a waveform characteristic variation quantity representing a variation quantity in waveform characteristic between an m-th frame and an (m-k)-th frame based on a waveform characteristic value in the m-th frame and a waveform characteristic value in the (m-k)-th frame, where m and k are independently integers of 1 or more. The SFO estimator estimates an SFO of the sample data signal based on the waveform characteristic variation quantity.
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