METHOD OF MANUFACTURING SEMICONDUCTOR ACTIVE LAYER, METHOD OF MANUFACTURING THIN FILM TRANSISTOR USING THE SAME AND THIN FILM TRANSISTOR HAVING SEMICONDUCTOR ACTIVE LAYER

摘要

A semiconductor active layer manufacturing method, a thin film transistor manufacturing method using the same, and a thin film transistor including a semiconductor active layer are provided to use an oxide semiconductor, in which a composition ratio of In is increased, as an active layer, thereby improving electric characteristics including slope factor and mobility of the thin film transistor. A gate electrode is formed on a substrate. A gate insulating layer is formed on the gate electrode. An IGZO layer is formed on the gate insulating layer. The IGZO layer is an active layer providing source and drain regions and a channel region. Source and drain electrodes are formed in order to be contacted with the source and drain regions. At this time, the IGZO layer is formed by depositing ions including Ga and Zn from a first target(22). Ions including In are deposited from a second target(24). A composition ratio of the In of the IGZO layer is about 45 to 80%. The first target is made of InGaZnO. The second target is made of InZnO. First and second bias powers(23,25) are applied to the first target and the second target. The composition ratio of the In is controlled by the size of the second bias power.