发明名称 Scanning microscope with evanescent wave illumination
摘要 A scanning microscope includes a light source for evanescently illuminating a sample disposed on a slide. A point detector receives detection light emanating from a scanning point of the sample. A beam deflection device disposed in an optical path of the detection light can shift a position of the scanning point.
申请公布号 US7480046(B2) 申请公布日期 2009.01.20
申请号 US20040573435 申请日期 2004.09.22
申请人 LEICA MICROSYSTEMS CMS GMBH 发明人 ULRICH HEINRICH;KNEBEL WERNER;MOELLMANN KYRA
分类号 G01J3/30;G01N21/63;G02B21/00;G02B21/02;G02B21/06;G02B21/08;G02B21/32 主分类号 G01J3/30
代理机构 代理人
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