发明名称 |
Scanning microscope with evanescent wave illumination |
摘要 |
A scanning microscope includes a light source for evanescently illuminating a sample disposed on a slide. A point detector receives detection light emanating from a scanning point of the sample. A beam deflection device disposed in an optical path of the detection light can shift a position of the scanning point.
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申请公布号 |
US7480046(B2) |
申请公布日期 |
2009.01.20 |
申请号 |
US20040573435 |
申请日期 |
2004.09.22 |
申请人 |
LEICA MICROSYSTEMS CMS GMBH |
发明人 |
ULRICH HEINRICH;KNEBEL WERNER;MOELLMANN KYRA |
分类号 |
G01J3/30;G01N21/63;G02B21/00;G02B21/02;G02B21/06;G02B21/08;G02B21/32 |
主分类号 |
G01J3/30 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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