发明名称 Multi-pulse heterodyne sub-carrier interrogation of interferometric sensors
摘要 A method for interrogating time-multiplexed interferometric sensors using multiple interrogation pulses so as to increases the allowable interrogation pulse duty-cycle and improve the signal-to-noise ratio. In each TDM repetition period a sequence of multiple interrogation pulses are generated. The pulses in the sequence are separated by a time that is equal to the sensor imbalance. The phase from pulse to pulse in each TDM time-slot is modulated at a different, linear rate such that the pulse in time-slot m will have an optical frequency that is shifted by mDeltanu, where Deltanu is the sub-carrier frequency. Because multiple reflections do not need to fade out the inventive method can enhance the signal-to-noise ratio of interferometric sensors such as inline Fabry-Perot sensors.
申请公布号 US7480056(B2) 申请公布日期 2009.01.20
申请号 US20040862123 申请日期 2004.06.04
申请人 OPTOPLAN AS 发明人 WAAGAARD OLE HENRIK;RONNEKLEIV ERLEND
分类号 G01B9/02;G01D5/26;G01D5/353;G02F;G02F1/21;H04B10/04;H04J14/08 主分类号 G01B9/02
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