发明名称 |
NONVOLATILE SEMICONDUCTOR MEMORY DEVICES FOR PREVENTING READ DISTURBANCE AND READ METHOD THEREOF |
摘要 |
A nonvolatile semiconductor memory device and a reading method thereof are provided to prevent a reading disturbance due to a leak current by supplying a predetermined positive voltage to a common source line. Memory cells of a memory cell array(210) have NAND or NOR structure. A control logic(220) controls overall operation of a nonvolatile memory device(200), and controls operation related to read and verify read. A voltage generator(230) generates voltages supplied to a selected word line, an unselected word line, a string select line, a ground select line, and a common source line. A row decoder(240) drives the selected word line, the unselected word line, the string select line, the ground select line, and the common source line in response to a row address. A page buffer(250) is operated as a sensing amplifier or a write driver. A column decoder(260) reads data stored in the page buffer in response to a column address.
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申请公布号 |
KR20090007054(A) |
申请公布日期 |
2009.01.16 |
申请号 |
KR20070070667 |
申请日期 |
2007.07.13 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
PARK, JUNG HOON;LEE, SUNG SOO;LIM, YOUNG HO;LEE, CHANG SUB;PARK, KI TAE |
分类号 |
G11C16/26;G11C16/08;G11C16/30 |
主分类号 |
G11C16/26 |
代理机构 |
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