| 摘要 |
In a field emission display (FED) device comprising: rows and columns of emitters; and an anode electrode, a method of measuring display attributes of said FED device comprising the steps of: a) in a scan fashion, individually driving each row and measuring the current drawn by each row, wherein a settling time is allowed after each row is driven; b) measuring a background current level during a vertical blanking interval; c) correcting current measurements taken during said step a) by said background current level to yield corrected current measurements; d) averaging multiple corrected current measurements taken over multiple display frames to produce averaged corrected current values for all rows of said FED device; and e) generating a memory resident correction table based on said averaged corrected current values. |
