发明名称 HIGH TEMPERATURE TESTING DEVICE
摘要 A high-temperature test apparatus is provided to test a specimen placed in the chamber more accurately by maintaining the inside of the chamber at the set temperature with no wind. A high-temperature test apparatus comprises an insulation layer(10), an air passage(20) in which a blower fan(50) equipped with a heater is installed on the top, a chamber(30) in which a temperature sensor(60) is equipped, and a controller(40) for the related control. An auxiliary heater(70) is also installed in the chamber in order to maintain the set temperature with no wind. The controller comprises an interface unit(41) which is connected with a temperature sensor and the auxiliary heater.
申请公布号 KR20090007034(A) 申请公布日期 2009.01.16
申请号 KR20070070622 申请日期 2007.07.13
申请人 THN CORPORATION 发明人 MIN, SU GEOL
分类号 G01N25/00;G01M99/00 主分类号 G01N25/00
代理机构 代理人
主权项
地址