| 摘要 |
In a device for testing electronic components, in particular ICs, under particular pressure conditions, the pressure test chamber comprises contact elements (13) which on the one hand are connected to an electronic testing device and on the other hand extend into a cavity of the pressure test chamber. Arranged inside the cavity of the pressure test chamber, there is an air-tight sealing board (26) which extends transversely over the contact elements (13) and is sealed peripherally from an assigned pressure chamber half (2). By means of the sealing board (26), first contact element sections (19) are separated air-tightly from second contact element sections (20) but are in electrically conductive connection.
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