发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF SEMICONDUCTOR DEVICE
摘要 <p>[PROBLEMS] To provide a semiconductor device capable of efficiently transmitting the stress generated in a stress film to a channel section, and provide a manufacturing method of the semiconductor device. [MEANS FOR SOLVING PROBLEMS] A semiconductor device is provided with a silicon (Si) substrate having a projected portion, a gate insulation film that is formed on the upper surface of the projected portion, a gate electrode that is formed on the gate insulation film, a source region and a drain region that are provided on the side part of the projected portion, a first sidewall comprising an insulating material provided on the side face of the projected portion and on the silicon (Si) substrate adjacent to the projected portion, a second sidewall that is arranged on the first sidewall and has a bottom surface formed lower than the upper surface with a Young's modulus higher than that of the silicon (Si) substrate, and a stress film that is formed on the gate electrode and the second sidewall.</p>
申请公布号 WO2009008082(A1) 申请公布日期 2009.01.15
申请号 WO2007JP63883 申请日期 2007.07.12
申请人 FUJITSU LIMITED;SHIMA, MASASHI 发明人 SHIMA, MASASHI
分类号 H01L29/78;H01L21/8238;H01L27/092 主分类号 H01L29/78
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