发明名称 SOLDER BUMP
摘要 <p>A solder bump is provided to prevent mechanical strength of the solder bump from decreasing by sequentially forming a copper post, silver plating layers and tin plating layers, thereby suppressing the production of Ag3Sn that is an intermetallic compound produced on an interface of the copper post and a solder. A solder bump(30) comprises a copper post(2), silver plating layers(4,8), and tin plating layers(6,10). The copper post is formed on a metal layer(12) forming an electronic component through the electroplating process. The silver plating layers and tin plating layers are sequentially formed on the copper post. The metal layer means a circuit pattern formed on a printed circuit board or a wafer level package. The solder bump further comprises a gold plating layer(14) formed between the metal layer and the copper post.</p>
申请公布号 KR100878916(B1) 申请公布日期 2009.01.15
申请号 KR20070094273 申请日期 2007.09.17
申请人 SAMSUNG ELECTRO-MECHANICS CO., LTD.;SUNGKYUNKWAN UNIVERSITY FOUNDATION FOR CORPORATE COLLABORATION 发明人 KIM, HO JIN;SUH, SU JEONG;KIM, JANG HYUN;PARK, IN SOO;LEE, YONG HO;NA, SEONG HUN;BAEK, YONG HO;CHOI, YOUNG SIK
分类号 B23K35/22;B23K35/00;B32B15/01;H01L21/60 主分类号 B23K35/22
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