| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device allowing a re-relief of a defective cell or a re-adjustment of property, even after the relief or the adjustment is carried out by once cutting off a fuse. SOLUTION: The device is equipped with: adjustment circuits B1, B2, ..., Bn; Vreg generation circuits C1, C2, ..., Cn respectively connected to the adjustment circuits B1, B2, ..., Bn; and a selection circuit for selecting optional one circuit from the Vreg generation circuits C1, C2, ..., Cn. This selection circuit includes: fuses F1, F2, ..., Fn; fuses f1, f2, ..., fn; resistance elements R1, R2, ..., Rn; resistance elements r1, r2, ..., rn; and AND circuits A1, A2, ..., An. This selection circuit selects the adjustment circuit B1 when the fuse F1 is cut down and select the adjustment circuit B2, not the adjustment circuit B1, when the fuse f1 and fuse F2 are cut down in addition to the fuse F1. COPYRIGHT: (C)2009,JPO&INPIT
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