摘要 |
<p>A cleaning composition for removing resist includes quaternary ammonium hydroxide, water, alkyl glycol aryl ether, dimethylsulfoxide and corrosion inhibitor of polyacrylic acid. The alkyl glycol of alkyl glycol aryl ether has 3-18 carbon atoms. The cleaning composition for removing resist may clean the resist on a metal, metal alloy or dielectric substrate and other residues, and has low etch rate for metals such as Al and Cu, and nonmetals such as SiO2.</p> |
申请人 |
ANJI MICROELECTRONICS (SHANGHAI) CO., LTD;SHI, ROBERT, YONGTAO;PENG, LIBBERT, HONGXIU;CAO, JENNY, HUIYING;LIU, BING |
发明人 |
SHI, ROBERT, YONGTAO;PENG, LIBBERT, HONGXIU;CAO, JENNY, HUIYING;LIU, BING |