发明名称 PROCESS FOR PRODUCING SEMICONDUCTOR DEVICE, SEMICONDUCTOR DEVICE, SEMICONDUCTOR PRODUCTION APPARATUS, AND STORAGE MEDIUM
摘要 <p>This invention provides a process for producing a semiconductor device, comprising a step (a) of activating an organic silane gas containing a phenyl group and silicon and free from nitrogen other than unavoidable impurities to produce plasma, and, in such a state that the temperature of a substrate is set at 200°C or below, exposing the substrate to the plasma to form a thin film containing a phenyl group and silicon on the substrate, and a step (b) of applying energy to the substrate to eliminate water from the thin film to form a low-permittivity film. This production process can provide an organic material-containing silicon oxide-type low-permittivity film which, when subjected to etching treatment, ashing treatment or other plasma treatment, does not cause any significant damage caused by the elimination of the organic matter.</p>
申请公布号 WO2009008376(A1) 申请公布日期 2009.01.15
申请号 WO2008JP62203 申请日期 2008.07.04
申请人 TOKYO ELECTRON LIMITED;KATO, YOSHIHIRO;KASHIWAGI, YUSAKU;MATSUMOTO, TAKASHI 发明人 KATO, YOSHIHIRO;KASHIWAGI, YUSAKU;MATSUMOTO, TAKASHI
分类号 H01L21/312;C23C16/42;H01L21/31;H01L21/768;H01L23/522 主分类号 H01L21/312
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