发明名称 4F2 SELF ALIGN FIN BOTTOM ELECTRODES FET DRIVE PHASE CHANGE MEMORY
摘要 Arrays of memory cells are described along with devices thereof and method for manufacturing. Memory cells described herein include memory elements comprising programmable resistive material and self-aligned bottom electrodes. In preferred embodiments the area of the memory cell is 4F2, F being the feature size for a lithographic process used to manufacture the memory cell, and more preferably F being equal to a minimum feature size. Arrays of memory cells described herein include memory cells arranged in a cross point array, the array having a plurality of word lines and source lines arranged in parallel in a first direction and having a plurality of bit lines arranged in parallel in a second direction perpendicular to the first direction.
申请公布号 US2009014706(A1) 申请公布日期 2009.01.15
申请号 US20070777392 申请日期 2007.07.13
申请人 MACRONIX INTERNATIONAL CO., LTD. 发明人 LUNG HSIANG LAN
分类号 H01L45/00 主分类号 H01L45/00
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