| 摘要 |
Method for testing integrated circuits using a self-test circuit contained within the circuit. Testing is begun using a self-test device or so-called built in self-test (BIST) module before the integrated circuit is connected to an external test device (ET) that reads in and or analyzes the results of the self-test. Independent claims are made for: (1) a self- test device for use with an integrated circuit including a self-test controller; (2) a self-test circuit that is able to shut off certain parts of the integrated circuit during testing; (3) a wafer containing a number of integrated circuits which are electrically connected during testing, but that are later cut apart following testing. |
