发明名称 Exposure apparatus and device manufacturing method
摘要 An immersion lithographic system for patterning a work piece arranged at an image plane and covered at least partly with a layer sensitive to electromagnetic radiation, includes: a source emitting electromagnetic radiation onto an object plane; a mask arranged at the object plane to relay the electromagnetic radiation toward the work piece; and an immersion medium contacting at least a portion of an immersion optics of the lithographic system and a portion of the work piece. The immersion medium is supplied through at least one orifice arranged in the immersion optics.
申请公布号 US2009015807(A1) 申请公布日期 2009.01.15
申请号 US20080230988 申请日期 2008.09.09
申请人 发明人 HIRUKAWA SHIGERU;MAGOME NOBUTAKA;TANAKA ISSEY
分类号 G03B27/42;G03B27/52;G03F7/20 主分类号 G03B27/42
代理机构 代理人
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