发明名称 |
Exposure apparatus and device manufacturing method |
摘要 |
An immersion lithographic system for patterning a work piece arranged at an image plane and covered at least partly with a layer sensitive to electromagnetic radiation, includes: a source emitting electromagnetic radiation onto an object plane; a mask arranged at the object plane to relay the electromagnetic radiation toward the work piece; and an immersion medium contacting at least a portion of an immersion optics of the lithographic system and a portion of the work piece. The immersion medium is supplied through at least one orifice arranged in the immersion optics.
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申请公布号 |
US2009015807(A1) |
申请公布日期 |
2009.01.15 |
申请号 |
US20080230988 |
申请日期 |
2008.09.09 |
申请人 |
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发明人 |
HIRUKAWA SHIGERU;MAGOME NOBUTAKA;TANAKA ISSEY |
分类号 |
G03B27/42;G03B27/52;G03F7/20 |
主分类号 |
G03B27/42 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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