| 摘要 |
<P>PROBLEM TO BE SOLVED: To provide an improved measuring field compared to a well-known technique for determining the smudge limitation in printing. <P>SOLUTION: The invention relates to the measuring field (A) for determining the smudge limitation in printing. The measuring field (A) is provided on top of a printing plate (1) containing the domains (C, D), to which an ink is led and printing is performed on the surface and the domain (B), to which a dampening liquid is led but printing is not performed on the surface, wherein the characteristic to lead the dampening liquid in the domain of the measuring field (A) is kept reduced with respect to the characteristic to lead the dampening water in the non-printed domain (B) on the surface of the printing plate (1) by providing a nanoscopic type cover (15) in the domain of the measuring field (A). <P>COPYRIGHT: (C)2009,JPO&INPIT |
