发明名称 SAMPLE TRANSFER METHOD OF TRANSMISSION ELECTRON MICROSCOPE
摘要 PROBLEM TO BE SOLVED: To provide a sample transfer method for a transmission electron microscope with operability improved by transferring a sample smoothly to a next mesh position when it approaches a grid part. SOLUTION: In transferring a sample held in the sample holder in the transmission electron microscope, its transmission image is obtained with the sample held by the sample holder, a statistical treatment is performed on the obtained sample and the transmission image of a grid of the sample holder, and a velocity of the sample transfer is controlled based on the statistical treatment. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009009771(A) 申请公布日期 2009.01.15
申请号 JP20070168597 申请日期 2007.06.27
申请人 JEOL LTD 发明人 ARIMA HIDEAKI
分类号 H01J37/20;H01J37/22 主分类号 H01J37/20
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