发明名称 METHOD FOR CONTROLLING REACTIVE SPUTTERING AND FILM DEPOSITION METHOD
摘要 PROBLEM TO BE SOLVED: To provide: a method for controlling reactive sputtering, by which all of each state of compound, transition and metal can seamlessly and stably controlled; and a film deposition method using reactive sputtering, by which film deposition can be stably performed at a high speed in a transition state without failure of film forming. SOLUTION: The method for controlling reactive sputtering comprises detecting the intensity of a light having a specified wavelength emitted from a plasma, that is changed according to the sputtering state, and then controlling the introduction amount of a reactive gas so that the detected intensity of the light becomes a predetermined value. In the method, the introduction amount of the reactive gas is controlled by first PID control so that the intensity of the light having the specified wavelength emitted from the plasma coincides with a target value, and the introduction amount of the reactive gas is controlled by second PID control so that the difference between the variation of the intensity of the light, expected by the first PID control, and the variation of the intensity of the light practically generated becomes small, and further, final control of the introduction amount of the reactive gas is performed by the total control output value of the obtained first PID control output value and second PID control output value. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009007600(A) 申请公布日期 2009.01.15
申请号 JP20070167879 申请日期 2007.06.26
申请人 AGC TECHNO GLASS CO LTD;ASAHI GLASS CO LTD 发明人 TATEMURA MITSUYUKI;MASHITA NAOHIRO
分类号 C23C14/34;C23C14/54;G02B5/26;G02B5/28 主分类号 C23C14/34
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