发明名称 METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device capable of preventing both crystallization and silicidation in an insulating film containing hafnium. SOLUTION: This production method includes: forming a laminate film in which an insulating film 13 containing hafnium is formed above a silicon layer 11 and a polysilicon layer 14 is formed on the insulating film 13; and subjecting the laminate film to heat treatment in an atmosphere produced by mixing oxygen with nitrogen and having a total pressure substantially equal to a partial pressure of the above nitrogen. COPYRIGHT: (C)2009,JPO&INPIT
申请公布号 JP2009010129(A) 申请公布日期 2009.01.15
申请号 JP20070169482 申请日期 2007.06.27
申请人 HANDOTAI RIKOUGAKU KENKYU CENTER:KK 发明人 OSHIMA MASAHARU;TAKAHASHI HARUHIKO;USUDA KOJI;RYU SHIEN;RIYUU KOKURIN;IKEDA KAZUTO;YOSHIMARU MASAKI
分类号 H01L21/316 主分类号 H01L21/316
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