发明名称 |
METHOD OF MANUFACTURING SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a method of manufacturing a semiconductor device capable of preventing both crystallization and silicidation in an insulating film containing hafnium. SOLUTION: This production method includes: forming a laminate film in which an insulating film 13 containing hafnium is formed above a silicon layer 11 and a polysilicon layer 14 is formed on the insulating film 13; and subjecting the laminate film to heat treatment in an atmosphere produced by mixing oxygen with nitrogen and having a total pressure substantially equal to a partial pressure of the above nitrogen. COPYRIGHT: (C)2009,JPO&INPIT
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申请公布号 |
JP2009010129(A) |
申请公布日期 |
2009.01.15 |
申请号 |
JP20070169482 |
申请日期 |
2007.06.27 |
申请人 |
HANDOTAI RIKOUGAKU KENKYU CENTER:KK |
发明人 |
OSHIMA MASAHARU;TAKAHASHI HARUHIKO;USUDA KOJI;RYU SHIEN;RIYUU KOKURIN;IKEDA KAZUTO;YOSHIMARU MASAKI |
分类号 |
H01L21/316 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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