发明名称 Method of manufacturing a semiconductor-on-insulator substrate for microelectronics and optoelectronics
摘要 <p>The method involves providing a substrate (7) with a silicon support (6), and forming a mask e.g. silicon nitride pattern (9), on a portion of strained silicon thin layer (3). Epitaxy of a strained silicon germanium layer is obtained, and a strained germanium layer is obtained by high temperature oxidation. The mask and a silicon oxide layer (4) are removed, and another mask is formed to protect zones of strained germanium and silicon portions of a semi-conducting thin layer. Epitaxy on the germanium portion is obtained to form a germanium thick layer, and the latter mask is removed.</p>
申请公布号 EP2015349(A1) 申请公布日期 2009.01.14
申请号 EP20080159811 申请日期 2008.07.07
申请人 COMMISSARIAT A L'ENERGIE ATOMIQUE 发明人 DAMLENCOURT, JEAN-FRANCOIS;CLAVELIER, LAURENT
分类号 H01L21/02 主分类号 H01L21/02
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